发明名称 FINFET WITH BOTTOM SIGE LAYER IN SOURCE/DRAIN
摘要 A FinFET includes a substrate, a fin structure on the substrate, a source in the fin structure, a drain in the fin structure, a channel in the fin structure between the source and the drain, a gate dielectric layer over the channel, and a gate over the gate dielectric layer. At least one of the source and the drain includes a bottom SiGe layer.
申请公布号 KR101492719(B1) 申请公布日期 2015.02.11
申请号 KR20130058486 申请日期 2013.05.23
申请人 发明人
分类号 H01L21/336;H01L29/78 主分类号 H01L21/336
代理机构 代理人
主权项
地址