| 摘要 |
<p>A measuring arrangement and a method for the three-dimensional measurement of at least part of an object includes a light source with a continuous spectrum, a device for generating a multifocal lighting pattern, a lens with a large chromatic aberration for imaging foci of the lighting pattern on the object, a detection unit for generating the wavelength spectrum of the foci that are confocally imaged on the object via the lens, and a spectrum-dispersive device disposed between the confocally imaged foci and the detection device. In order to create a highly accurate surface profile in a relatively short time even in the case of moving objects, the invention proposes that a first hole pattern including first holes be disposed in the plane of the confocally imaged foci, the geometric arrangement of the first holes corresponding to the geometric arrangement of the foci of the multifocal lighting pattern.</p> |
