发明名称 PROBABILISTIC FATIGUE LIFE PREDICTION USING ULTRASONIC INSPECTION DATA CONSIDERING EIFS UNCERTAINTY
摘要 <p>A method for probabilistically predicting fatigue life in materials includes sampling a random variable for an actual equivalent initial flaw size (EIFS), generating random variables for parameters (ln C, m) of a fatigue crack growth equation  a  N = C  ( Delta   K ) m from a multivariate distribution, and solving the fatigue crack growth equation using these random variables. The reported EIFS data is obtained by ultrasonically scanning a target object, recording echo signals from the target object, and converting echo signal amplitudes to equivalent reflector sizes using previously recorded values from a scanned calibration block. The equivalent reflector sizes comprise the reported EIFS data.</p>
申请公布号 EP2834631(A1) 申请公布日期 2015.02.11
申请号 EP20130716145 申请日期 2013.04.03
申请人 SIEMENS CORPORATION;SIEMENS AKTIENGESELLSCHAFT 发明人 GUAN, XUEFEI;ZHANG, JINGDAN;KADAU, KAI;ZHOU, SHAOHUA, KEVIN
分类号 G01N29/44;G01N17/00 主分类号 G01N29/44
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