发明名称 MANUFACTURING METHOD OF SEMICONDUCTOR DEVICE
摘要 <p>To provide a semiconductor device with high performance and low cost and a manufacturing method thereof. A first region including a separated (cleavage) single-crystal semiconductor layer and a second region including a non-single-crystal semiconductor layer are provided over a substrate. It is preferable that laser beam irradiation be performed to the separated (cleavage) single-crystal semiconductor layer in an inert atmosphere, and laser beam irradiation be performed to the non-single-crystal semiconductor layer in an air atmosphere at least once.</p>
申请公布号 KR101492464(B1) 申请公布日期 2015.02.11
申请号 KR20080047895 申请日期 2008.05.23
申请人 发明人
分类号 H01L21/20;H01L21/26;H01L21/265 主分类号 H01L21/20
代理机构 代理人
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