发明名称 Semiconductor device and method of fabrication
摘要 A semiconductor memory device employs a SONOS type memory architecture and includes a bit line diffusion layer in a shallow trench groove in which a conductive film is buried. This makes it possible to decrease the resistivity of the bit line diffusion layer without enlarging the area on the main surface of the semiconductor substrate, and to fabricate the semiconductor memory device having stable electric characteristics without enlarging the cell area. The bit line is formed by implanting ions into the sidewall of Si3N4.
申请公布号 US8952536(B2) 申请公布日期 2015.02.10
申请号 US200812199690 申请日期 2008.08.27
申请人 Spansion LLC 发明人 Higashi Masahiko;Nansei Hiroyuki
分类号 H01L23/52;H01L27/105;H01L21/265;H01L27/115 主分类号 H01L23/52
代理机构 代理人
主权项 1. A semiconductor device comprising: a buried bit line structure having a groove in which a bit line is buried; a conductive layer on an inner surface of the groove; and an insulation film in contact with the conductive layer, the insulation film provided only along a side wall surface of the groove.
地址 Sunnyvale CA US