发明名称 Contact landing pads for a semiconductor device and methods of making same
摘要 A method of forming a conductive contact landing pad and a transistor includes forming first and second spaced-apart active regions in a semiconducting substrate, forming a layer of gate insulation material on the first and second active regions, and performing an etching process to remove the layer of gate insulation material formed on the second active region so as to thereby expose the second active region. The method further includes performing a common process operation to form a gate electrode structure above the layer of gate insulation material on the first active region for the transistor and the conductive contact landing pad that is conductively coupled to the second active region, and forming a contact to the conductive contact landing pad.
申请公布号 US8951920(B2) 申请公布日期 2015.02.10
申请号 US201414446797 申请日期 2014.07.30
申请人 GLOBALFOUNDRIES Inc. 发明人 Jakubowski Frank;Faul Juergen
分类号 H01L21/31;H01L23/495 主分类号 H01L21/31
代理机构 Amerson Law Firm, PLLC 代理人 Amerson Law Firm, PLLC
主权项 1. A method, comprising: forming first and second spaced-apart active regions in a semiconducting substrate; forming a conductive material layer above said first and second active regions during a same material deposition sequence; patterning said conductive material layer during a same material patterning sequence so as to form a gate electrode of a transistor element above said first active region and to form a conductive contact landing pad above said second active region, said conductive contact landing pad being conductively coupled to said second active region.
地址 Grand Cayman KY