发明名称 Memory device and method of forming the same
摘要 Provided is a memory device including a first dielectric layer, a T-shaped gate, two charge storage layers and two second dielectric layers. The first dielectric layer is disposed on a substrate. The T-shaped gate is disposed on the first dielectric layer and has an upper gate and a lower gate, wherein two gaps are present respectively at both sides of the lower gate and between the upper gate and the substrate. The charge storage layers are respectively embedded into the gaps. A second dielectric layer is disposed between each charge storage layer and the upper gate, between each charge storage layer and the lower gate and between each charge storage layer and the substrate.
申请公布号 US8952440(B2) 申请公布日期 2015.02.10
申请号 US201313774449 申请日期 2013.02.22
申请人 MACRONIX International Co., Ltd. 发明人 Yan Shih-Guei;Tsai Wen-Jer;Tsai Ping-Hung
分类号 H01L29/788;H01L21/28 主分类号 H01L29/788
代理机构 J.C. Patents 代理人 J.C. Patents
主权项 1. A memory device, comprising: a first dielectric layer, disposed on a substrate; a T-shaped gate, disposed on the first dielectric layer and having an upper gate and a lower gate, wherein two gaps are present respectively at two sides of the lower gate and between the upper gate and the substrate, and the upper gate and the lower gate are in direct contact with each other; two charge storage layers, respectively embedded into the gaps, wherein a bottom of each of the charge storage layers is not lower than a top of the first dielectric layer; and a second dielectric layer, disposed between each charge storage layer and the upper gate, between each charge storage layer and the lower gate and between each charge storage layer and the substrate.
地址 Hsinchu TW