LED chip testing device

摘要

The present invention provides an LED chip testing device that measures characteristics of an LED chip.;The LED chip testing device includes: a rotation member that supports the LED chip and rotates the LED chip to a testing position where the characteristics of the LED chip are tested; and a tester installed next to the rotation member and serving to measure the characteristics of the LED chip at the testing position.

主权项

1. A light emitting diode (LED) chip testing apparatus that measures characteristics of an LED chip, the apparatus comprising:
a rotation member that supports the LED chip and rotates the LED chip to a testing position where the characteristics of the LED chip are tested, wherein the rotation member includes:
a plurality of supporting frames, each of the plurality of supporting frames extending in radial directions with respect to a rotational axis such that the plurality of supporting frames are separated from each other; anda plurality of mounting members, each of which is installed at an end portion of corresponding one of the plurality of supporting frames and serves to mount thereon the LED chip; a tester installed next to the rotation member and serving to measure the characteristics of the LED chip at the testing position, wherein the tester includes:
a contact unit that comes into contact with the LED chip at the testing position and thus makes the LED chip light emit; anda measurement unit that measures an optical characteristic of the LED chip at the testing position; and a conveyance member that reflects the light emitted in a lateral direction from the LED chip and conveys the reflected light toward the measurement unit, wherein: the conveyance member includes a conveyance surface that conveys the light emitted from the LED chip to the measurement unit; the conveyance surface is provided with a passing hole through which the light emitted from the LED chip passes; a size of the passing hole is gradually reduced in a direction facing toward the LED chip located at the testing position from the measurement unit; and the entire or a part of the conveyance surface is covered with a mirror coating.