发明名称 Apparatus and method for reading a phase-change memory cell
摘要 An apparatus and a method for reading a phase-change memory cell are described. A circuit includes a current ramp circuit. A current forcing module is coupled with the current ramp circuit. A Veb emulation circuit is coupled with the current forcing module by a voltage adder, the voltage adder to sum an output from the Veb emulation circuit and a high impedance voltage source. A method includes forcing a current ramp into both a bitline and a dummy bitline, the dummy bitline having a voltage. The method also includes tripping a comparator when the current ramp provides a storage voltage with a predefined value, the storage voltage associated with the phase-change memory cell, and the predefined value independent from a resistance value of the phase-change memory cell and added in series to the voltage of the dummy bitline.
申请公布号 US8953360(B2) 申请公布日期 2015.02.10
申请号 US200913514532 申请日期 2009.12.10
申请人 Micron Technology, Inc. 发明人 Bedeschi Ferdinando
分类号 G11C13/00;G11C11/56 主分类号 G11C13/00
代理机构 Schwegman Lundberg & Woessner, P.A. 代理人 Schwegman Lundberg & Woessner, P.A.
主权项 1. A circuit for reading a phase-change memory cell, the circuit comprising: a current ramp circuit; a current forcing module coupled with the current ramp circuit; and a Veb emulation circuit coupled with the current forcing module by a voltage adder, the voltage adder to sum an output from the Veb emulation circuit and a high impedance voltage source.
地址 Boise ID US