发明名称 Autoanalyzer and probe elevating method
摘要 An autoanalyzer includes a measurement unit which measures a reaction liquid produced by an interaction between a reagent and an examined sample contained in a reaction container, a sample probe which sucks the examined sample from a sample container and discharges the examined sample to the reaction container, a probe elevating arm which elevates the sample probe with respect to the sample container, and a control unit which controls the probe elevating arm so that a speed at which the sample probe enters a liquid surface of the examined sample to perform an n-th suction operation (n≧2) of the examined sample is slower than a speed at which the sample probe enters the liquid surface of the examined sample to perform a first suction operation of the examined sample.
申请公布号 US8951470(B2) 申请公布日期 2015.02.10
申请号 US200812179620 申请日期 2008.07.25
申请人 Kabushiki Kaisha Toshiba;Toshiba Medical Systems Corporation 发明人 Oonuma Takehiko
分类号 C12Q1/68;G01N35/10;G01N35/00 主分类号 C12Q1/68
代理机构 Oblon, Spivak, McClelland, Maier & Neustadt, L.L.P. 代理人 Oblon, Spivak, McClelland, Maier & Neustadt, L.L.P.
主权项 1. An autoanalyzer comprising: a measurement unit which measures a reaction liquid produced by an interaction between a reagent and an examined sample accommodated in a reaction container; a sample probe which sucks the examined sample from a sample container and discharges the examined sample to the reaction container; a probe elevating mechanism which elevates the sample probe with respect to the sample container; a liquid surface detector which detects a liquid surface of the examined sample; a storage which stores a level of the liquid surface of the examined sample detected by the liquid surface detector, during a first suction operation of the examined sample; and a control unit which controls the probe elevating mechanism based on the level of the liquid surface of the examined sample stored in the storage to control a speed of lowering the probe in a pre-entering period prior to the probe entering the liquid surface and an entering period when the probe enters the liquid surface, and wherein during a first suction operation the probe is lowered at a first speed during both the pre-entering period and the entering period, and in a second suction operation of the examined sample, performed after the first suction operation, the probe is lowered at a second speed greater than the first speed in the pre-entering period and is lowered at a third speed less than the first speed during the entering period, and so that an entering speed of the sample probe at which the sample probe enters the liquid surface of the examined liquid in the second suction operation performed after the first suction operation is slower than an entering speed of the sample probe at which the sample probe enters the liquid surface of the examined sample in the first suction operation.
地址 Tokyo JP