发明名称 |
Reaction apparatus for processing wafer, electrostatic chuck and wafer temperature control method |
摘要 |
This invention discloses a reaction apparatus for wafer treatment, an electrostatic chuck and a wafer temperature control method, in the field of semiconductor processing. The electrostatic chuck comprises an insulating layer for supporting a wafer and a lamp array disposed in the insulating layer. Each lamp of the lamp array can be independently controlled to turn on and off and/or to adjust the output power. By controlling the on/off switch and/or output power of each lamp of the lamp array the temperature of the wafer held on the ESC is adjusted and temperature non-uniformity can be more favorably adjusted, greatly improving wafer temperature uniformity, particularly alleviating non-radial temperature non-uniformity. |
申请公布号 |
US8952297(B2) |
申请公布日期 |
2015.02.10 |
申请号 |
US201213351741 |
申请日期 |
2012.01.17 |
申请人 |
Semiconductor Manufacturing International (Beijing) Corporation |
发明人 |
He Qiyang;Zhang Yiying |
分类号 |
F27B5/14;H01L21/67;H01L21/683;H05B1/00 |
主分类号 |
F27B5/14 |
代理机构 |
Koppel, Patrick, Heybl & Philpott |
代理人 |
Koppel, Patrick, Heybl & Philpott ;Ram Michael J. |
主权项 |
1. An electrostatic chuck (ESC) for holding a wafer, comprising:
an insulating layer for supporting a wafer; and a lamp array disposed in the insulating layer. |
地址 |
Beijing CN |