发明名称 CONTACT STRUCTURE OF SEMICONDUCTOR DEVICE
摘要 The present disclosure relates to a contact structure of a semiconductor device. A preferable structure for a contact structure of the semiconductor device includes: a substrate including a main surface; a fin structure extending from the main surface of the substrate upwards, the fin structure including a first fin, a second fin, and a third fin between the first fin and a second fin; a first germanium material on the first fin wherein the first bottom surface of the first germanium material has a first acute angle to the main surface; a second germanium material on the second pin opposite to the first germanium material in the third fin, practically in mirror symmetry; and a third germanium material on the third fin wherein the third bottom surface of the third germanium material has a second acute angel which is smaller than the first acute angle to the main surface.
申请公布号 KR20150015341(A) 申请公布日期 2015.02.10
申请号 KR20130142210 申请日期 2013.11.21
申请人 发明人
分类号 H01L21/28 主分类号 H01L21/28
代理机构 代理人
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