| 摘要 |
<p>The present invention relates to an electrical test socket, and more specifically, to an electrical test socket which is disposed between a terminal of a device under to electrically connect the terminal and the pad. The electrical test socket comprises: a socket body in which a center hole is formed in the center so as to accommodate a device under test to an inside; a pin connector which comprises a plurality of conductive pins are disposed at every position corresponding to the terminal of the device under test accommodated in the center of the socket body and contact the terminal of the device under test and a housing having a through hole into which the conductive pins are inserted so as to support each of the conductive pins; and a sheet type connector in which a plurality of conductive parts are disposed at every position corresponding to the conductive pins, the plurality of conductive parts disposed on a lower side of the pin connector, being conductive in only a thickness direction, and being elastically deformable in the thickness direction. The conductive pins have a square pillar shape.</p> |
