| 摘要 |
<p>Disclosed is a test socket for an SSD, which can mount and fix an SSD to perform an electrical test of the SSD. The test socket for an SSD comprises: a base substrate; a first base block and a second base block installed on the base substrate in the longitudinal direction of the base substrate with a gap therebetween; a first cover and a second cover respectively installed in the first base block and the second base block to be rotated and covering an SSD mounted on the base substrate to fix the SSD; a pair of guide blocks installed in parallel on both sides of the base substrate to be disposed between the first base block and the second base block; first and second latches respectively installed in the first cover and the second cover and locked by being fitted to protrusions on both ends of the guide blocks when the first cover and the second cover are closed; and a release unit to release the locking state of the first latch and the second latch at the same time to open the first cover and the second cover at the same time.</p> |
