发明名称 METHODS OF MAKING MULTI-STATE NON-VOLATILE MEMORY CELLS
摘要 A semiconductor device includes a region in a semiconductor substrate having a top surface with a first charge storage layer on the top surface. A first conductive line is on the first charge storage layer. A second charge storage layer is on the top surface. A second conductive line is on the second charge storage layer. A third charge storage layer is on the top surface. A third conductive line is on the third charge storage layer. A fourth charge storage layer has a first side adjoining a first sidewall of the first conductive line and a second side adjoining a first sidewall of the second conductive line. A fifth charge storage layer has a first side adjoining a second sidewall of the second conductive line and a second side adjoining a first sidewall of the third conductive line. Source and drain regions are formed in the substrate on either side of the semiconductor device.
申请公布号 US2015037958(A1) 申请公布日期 2015.02.05
申请号 US201414516918 申请日期 2014.10.17
申请人 FREESCALE SEMICONDUCTOR, INC. 发明人 HALL MARK D.;SHROFF MEHUL D.
分类号 H01L29/66;H01L29/06;H01L21/311;H01L29/51;H01L21/28;H01L29/423;H01L21/02 主分类号 H01L29/66
代理机构 代理人
主权项
地址 Austin TX US