| 摘要 |
A method for determining a location of a reflecting scatterer (S) in a medium (M) comprising a transmitting step in which a transducer (4) emits a transmit wave (T), a receiving step in which a receive array (3) provide transducer signals in response to a reflected wave (R), a beam forming step in which beam formed signals are computed, an interferometric processing step during which a complex interferometric signal is determined as a function of products of beam formed signals and conjugate of beam formed signals and a location determining step in which interferometric beam samples are selected from the complex interferometric signal, based on their complex arguments. The selected interferometric beam samples are indicatives of the location of the reflecting scatterer (S). |
