发明名称 |
SOLID-STATE IMAGING DEVICE, METHOD OF MANUFACTURING SOLID-STATE IMAGING DEVICE, AND CAMERA MODULE |
摘要 |
According to one embodiment of the present invention, a solid-state imaging device is provided. The solid-state imaging device includes a photoelectric conversion element, a first insulating film, a metal oxide film, an antireflection film, and a second insulating film. The photoelectric conversion element photoelectrically converts incident light into charges and stores the converted charges. The first insulating film is provided on a light-receiving surface of the photoelectric conversion element. The metal oxide film is provided on a light-receiving surface of the first insulating film. The antireflection film is provided on a light-receiving surface of the metal oxide film. The second insulating film is formed between the metal oxide film and the antireflection film, and has a thickness of 1 nm or more and 10 nm or less. |
申请公布号 |
US2015036031(A1) |
申请公布日期 |
2015.02.05 |
申请号 |
US201414197675 |
申请日期 |
2014.03.05 |
申请人 |
Kabushiki Kaisha Toshiba |
发明人 |
KAMIMURA Masaki |
分类号 |
H01L31/0216;H04N5/361;H01L31/18 |
主分类号 |
H01L31/0216 |
代理机构 |
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代理人 |
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主权项 |
1. A solid-state imaging device comprising:
a photoelectric conversion element that photoelectrically converts incident light into charges and stores the converted charges; a first insulating film that is provided on a light-receiving surface of the photoelectric conversion element; a metal oxide film provided on a light-receiving surface of the first insulating film; an antireflection film formed on a side close to a light-receiving surface of the metal oxide film; and a second insulating film formed between the metal oxide film and the antireflection film, and having a thickness of 1 nm or more and 10 nm or less. |
地址 |
Minato-ku JP |