发明名称 SOLID-STATE IMAGING DEVICE, METHOD OF MANUFACTURING SOLID-STATE IMAGING DEVICE, AND CAMERA MODULE
摘要 According to one embodiment of the present invention, a solid-state imaging device is provided. The solid-state imaging device includes a photoelectric conversion element, a first insulating film, a metal oxide film, an antireflection film, and a second insulating film. The photoelectric conversion element photoelectrically converts incident light into charges and stores the converted charges. The first insulating film is provided on a light-receiving surface of the photoelectric conversion element. The metal oxide film is provided on a light-receiving surface of the first insulating film. The antireflection film is provided on a light-receiving surface of the metal oxide film. The second insulating film is formed between the metal oxide film and the antireflection film, and has a thickness of 1 nm or more and 10 nm or less.
申请公布号 US2015036031(A1) 申请公布日期 2015.02.05
申请号 US201414197675 申请日期 2014.03.05
申请人 Kabushiki Kaisha Toshiba 发明人 KAMIMURA Masaki
分类号 H01L31/0216;H04N5/361;H01L31/18 主分类号 H01L31/0216
代理机构 代理人
主权项 1. A solid-state imaging device comprising: a photoelectric conversion element that photoelectrically converts incident light into charges and stores the converted charges; a first insulating film that is provided on a light-receiving surface of the photoelectric conversion element; a metal oxide film provided on a light-receiving surface of the first insulating film; an antireflection film formed on a side close to a light-receiving surface of the metal oxide film; and a second insulating film formed between the metal oxide film and the antireflection film, and having a thickness of 1 nm or more and 10 nm or less.
地址 Minato-ku JP