发明名称 |
DYNAMIC BUILT-IN SELF-TEST SYSTEM |
摘要 |
A method of performing a dynamic built-in self-test (BIST). The method includes performing a first test of a circuit on a semiconductor chip. The first test includes a first switch factor. The circuit during the first test is monitored with one or more sensors. A first sensor value of one or more sensors monitoring the circuit is determined. It is also determined whether the first sensor value is within a range of a programmable constant. A second switch factor is determined in response to determining that the first sensor value outside the range of the programmable constant. |
申请公布号 |
US2015039957(A1) |
申请公布日期 |
2015.02.05 |
申请号 |
US201313955619 |
申请日期 |
2013.07.31 |
申请人 |
International Business Machines Corporation |
发明人 |
Douskey Steven M.;Fitch Ryan A.;Hamilton Michael J.;Kaufer Amanda R. |
分类号 |
G06F11/27 |
主分类号 |
G06F11/27 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
Armonk NY US |