| 发明名称 |
METHOD, APPARATUS AND EQUIPMENT OF INSPECTING QUALITY OF LCD |
| 摘要 |
A method, an apparatus and an equipment of inspecting the quality of an LCD are provided, the method includes: obtaining optical parameters of the LCD; capturing images of the LCD; and determining that the LCD is defective after determining that the optical parameters are not in the range of the preset optical parameters and/or the captured images of the LCD are not consistent with the pre-stored images. Through the technical solution of the present invention, it can effectively differentiate the defect types of a product and record the defect position of the product, thereby it can effectively reduce misjudgment or miss test caused by the visual differences between operators to improve the quality and yield of manufactured LCD. |
| 申请公布号 |
US2015036913(A1) |
申请公布日期 |
2015.02.05 |
| 申请号 |
US201314354792 |
申请日期 |
2013.12.10 |
| 申请人 |
BOE TECHNOLOGY GROUP CO., LTD. ;BEIJING BOE OPTOELECTRONICS TECHNOLOGY CO., LTD. |
发明人 |
Yin Yanyan;Xue Jing;Xing Hongyan;Cui Ziwei;Han Falong |
| 分类号 |
G06T7/00 |
主分类号 |
G06T7/00 |
| 代理机构 |
|
代理人 |
|
| 主权项 |
1. A method of inspecting the quality of a liquid crystal display (LCD), comprising:
obtaining optical parameters of the LCD; capturing images of the LCD; and if determining that the optical parameters are not in a range of preset optical parameters and/or the captured images of the LCD are not consistent with pre-stored images, deciding that the LCD is defective. |
| 地址 |
Beijing CN |
