发明名称 SEMICONDUCTOR DEVICE STRUCTURES INCLUDING ENERGY BARRIERS, AND RELATED METHODS
摘要 A semiconductor device structure includes a transistor with an energy barrier beneath its transistor channel. The energy barrier prevents leakage of stored charge from the transistor channel into a bulk substrate. Methods for fabricating semiconductor devices that include energy barriers are also disclosed.
申请公布号 US2015035082(A1) 申请公布日期 2015.02.05
申请号 US201414518567 申请日期 2014.10.20
申请人 Micron Technology, Inc. 发明人 Mouli Chandra V.
分类号 H01L29/10;H01L29/66;H01L29/78;H01L21/326 主分类号 H01L29/10
代理机构 代理人
主权项 1. A method for increasing charge duration within a channel of a transistor, comprising: forming an energy barrier consisting essentially of carbonated silicon on a surface of a base substrate; forming a source region, a drain region, and a silicon channel of a transistor on the energy barrier; and applying a charge to the channel.
地址 Boise ID US