发明名称 |
SEMICONDUCTOR DEVICE STRUCTURES INCLUDING ENERGY BARRIERS, AND RELATED METHODS |
摘要 |
A semiconductor device structure includes a transistor with an energy barrier beneath its transistor channel. The energy barrier prevents leakage of stored charge from the transistor channel into a bulk substrate. Methods for fabricating semiconductor devices that include energy barriers are also disclosed. |
申请公布号 |
US2015035082(A1) |
申请公布日期 |
2015.02.05 |
申请号 |
US201414518567 |
申请日期 |
2014.10.20 |
申请人 |
Micron Technology, Inc. |
发明人 |
Mouli Chandra V. |
分类号 |
H01L29/10;H01L29/66;H01L29/78;H01L21/326 |
主分类号 |
H01L29/10 |
代理机构 |
|
代理人 |
|
主权项 |
1. A method for increasing charge duration within a channel of a transistor, comprising:
forming an energy barrier consisting essentially of carbonated silicon on a surface of a base substrate; forming a source region, a drain region, and a silicon channel of a transistor on the energy barrier; and applying a charge to the channel. |
地址 |
Boise ID US |