发明名称 HIGH TEMPERATURE HEATING SYSTEM
摘要 A heating system for use in mechanical testing at scales of microns or less includes a stage heater. The stage heater having a stage plane, and a stage heating element distributed across the stage plane. Two or more support mounts are on opposed sides of the stage plane. A first bridge extends from the stage plane to a first mount of the two or more support mounts, and a second bridge extends from the stage plane to a second mount of the two or more support mounts. The first and second bridges provide a plurality of supports between the stage plane and two or more support mounts to accordingly support the stage plane. In another example, the heating system includes a probe heater configured to heat a probe as part of mechanical testing.
申请公布号 US2015033835(A1) 申请公布日期 2015.02.05
申请号 US201214361133 申请日期 2012.11.28
申请人 Hysitron, Inc. 发明人 Asif Syed Amanulla Syed;Cyrankowski Edward;Keranen Lucas Paul;Major Ryan;Oh Yunjie;Warren Oden Lee
分类号 G01N3/54;H05B3/32;G01N3/08;H05B1/02 主分类号 G01N3/54
代理机构 代理人
主权项 1. A testing assembly for use in testing at a scale of microns or less, the testing system comprising: a heating system configured to heat a sample and a probe, the heating system including: a stage heater having a stage plane and a stage heating element distributed across the stage plane, wherein the stage heating element covers the stage plane from a first stage plane edge to a second stage plane edge and from a first stage plane end to a second stage plane end, the stage heater configured to heat a sample positioned on the stage plane;a probe heater having a probe heating element coupled with a probe configured for testing the sample coupled with the stage plane, the probe heater configured to heat the probe;a stage coupled with the stage heater; anda transducer assembly coupled with the probe heater.
地址 Eden Prairie MN US