发明名称 DETECTOR AND CHARGED PARTICLE BEAM DEVICE
摘要 <p>PROBLEM TO BE SOLVED: To provide a detector capable of achieving high detection sensitivity by effectively transferring light generated in a scintillator to a photodetector.SOLUTION: A detector 100 detects a scattered charged particle beam EBscattered by a sample with an irradiation of a charged particle beam and allowing a transmitting charged particle beam EBtransmitting through the sample to pass therethrough. The detector includes: a scintillator 10 provided with a first through hole 12 for passing the transmitting charged particle beam EBand converting the scattered charged particle beam EBinto light; a pipe section 20 allowing light generated in the scintillator 10 to enter through a first opening to be emitted through a second opening; a light guide 30 for guiding light emitted through the second opening; and a photo-detection section 40 for detecting light guided by the light guide 30. A second through hole 26 for passing the transmitting charged particle beam EBtherethrough is provided in the pipe section 20.</p>
申请公布号 JP2015026596(A) 申请公布日期 2015.02.05
申请号 JP20140051170 申请日期 2014.03.14
申请人 JEOL LTD 发明人 KANEKO TAKESHI
分类号 H01J37/244;H01J37/28 主分类号 H01J37/244
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