发明名称 NONVOLATILE MEMORY DEVICE AND METHOD OF MANUFACTURING THE SAME
摘要 A nonvolatile memory device includes gate electrodes three dimensionally arranged on a semiconductor substrate, a semiconductor pattern extending from the semiconductor substrate and crossing sidewalls of the gate electrodes, a metal liner pattern formed between the semiconductor pattern and formed on a top surface and a bottom surface of each of the gate electrodes, and a charge storage layer formed between the semiconductor pattern and the metal liner pattern.
申请公布号 US2015035042(A1) 申请公布日期 2015.02.05
申请号 US201414486547 申请日期 2014.09.15
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 Lee SunWoo;Lee Sangwoo;Lee Changwon;Lee Jeonggil
分类号 H01L27/115;H01L29/49 主分类号 H01L27/115
代理机构 代理人
主权项 1. A nonvolatile memory device comprising: a stack structure including a plurality of gate electrodes and a plurality of insulating patterns alternately and vertically stacked on a substrate; a channel structure penetrating the stack structure; and a charge storage layer formed between the channel structure and the stack structure, wherein each of the gate electrodes includes a metal pattern and a metal liner pattern between the metal pattern and the channel structure.
地址 Suwon-si KR