发明名称 |
NONVOLATILE MEMORY DEVICE AND METHOD OF MANUFACTURING THE SAME |
摘要 |
A nonvolatile memory device includes gate electrodes three dimensionally arranged on a semiconductor substrate, a semiconductor pattern extending from the semiconductor substrate and crossing sidewalls of the gate electrodes, a metal liner pattern formed between the semiconductor pattern and formed on a top surface and a bottom surface of each of the gate electrodes, and a charge storage layer formed between the semiconductor pattern and the metal liner pattern. |
申请公布号 |
US2015035042(A1) |
申请公布日期 |
2015.02.05 |
申请号 |
US201414486547 |
申请日期 |
2014.09.15 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
Lee SunWoo;Lee Sangwoo;Lee Changwon;Lee Jeonggil |
分类号 |
H01L27/115;H01L29/49 |
主分类号 |
H01L27/115 |
代理机构 |
|
代理人 |
|
主权项 |
1. A nonvolatile memory device comprising:
a stack structure including a plurality of gate electrodes and a plurality of insulating patterns alternately and vertically stacked on a substrate; a channel structure penetrating the stack structure; and a charge storage layer formed between the channel structure and the stack structure, wherein each of the gate electrodes includes a metal pattern and a metal liner pattern between the metal pattern and the channel structure. |
地址 |
Suwon-si KR |