发明名称 FIB-SEM ARRAY TOMOGRAPHY
摘要 Methods and devices for magnified imaging of three-dimensional samples are disclosed. The methods include imaging sample sections of a sample section series using a first particle-optical device. Coordinates of the imaged sample point are acquired and stored in such a way that the coordinates of the imaged sample point can be associated with the respective image of this sample point. The method also includes selecting a volume of interest (VOI), and transmitting the coordinates of the selected VOI to a second particle-optical device. In addition, the method includes imaging the selected VOI by means of the second particle-optical device. A plurality of planes of a sample section are imaged in order to obtain a 3D image of the selected VOI.
申请公布号 US2015036122(A1) 申请公布日期 2015.02.05
申请号 US201414339691 申请日期 2014.07.24
申请人 Carl Zeiss Microscopy GmbH ;Ruprecht-Karls-Universitaet-Heidelberg 发明人 Edelmann Martin;Elli Alexandra F.;Schertel Andreas;Schroeder Rasmus
分类号 G01N23/00;G01N21/17 主分类号 G01N23/00
代理机构 代理人
主权项 1. A method, comprising: using a first particle-optical device to image sample sections of a series of sample sections, coordinates of an imaged point of the sample being acquired and stored so that the coordinates of the imaged point of the sample are associated with the image of the point of the sample; selecting a volume of interest of the sample (VOI); transmitting the coordinates of the selected VOI to a second particle-optical device; and using the second particle-optical device to image the selected VOI, wherein the method comprises imaging a plurality of planes of a sample section to obtain a 3D image of the selected VOI.
地址 Jena DE