| 发明名称 |
APPARATUS FOR AMPLIFYING INTENSITY DURING TRANSMISSION SMALL ANGLE- X-RAY SCATTERING MEASUREMENTS |
| 摘要 |
The disclosure provides an apparatus for amplifying scattering intensity during tSAXS measurements. The apparatus includes an enhancement grating object and a placement mechanism. The enhancement grating object is positioned within a longitudinal coherence length of an incident X-ray from a target object. The placement mechanism is capable of placing the enhancement grating object with nanometer precision with respect to the target object in both a lateral and a longitudinal directions. |
| 申请公布号 |
US2015036805(A1) |
申请公布日期 |
2015.02.05 |
| 申请号 |
US201414246702 |
申请日期 |
2014.04.07 |
| 申请人 |
Industrial Technology Research Institute |
发明人 |
FU Wei-En;WU Wen-Li |
| 分类号 |
G21K1/06;G01N23/201 |
主分类号 |
G21K1/06 |
| 代理机构 |
|
代理人 |
|
| 主权项 |
1. An apparatus for amplifying scattering intensity during transmission small-angle X-ray scattering (tSAXS) measurements, comprising:
an enhancement grating object positioned within a longitudinal coherence length of an incident X-ray from a target object; and a placement mechanism capable of placing the enhancement grating object with nanometer precision with respect to the target object in both a lateral and a longitudinal directions. |
| 地址 |
Hsinchu TW |
