发明名称 半導体装置およびその製造方法
摘要 <p>A semiconductor device includes a transistor that has a trench formed in an element forming region of a substrate, a gate insulating film formed on side faces and a bottom face of the trench, a gate electrode formed on the gate insulating film so as to bury the trench, a source region formed on one side in the gate longitude direction, which is formed on the surface of the substrate, and a drain region formed on the other side in the gate longitude direction. Here, the gate electrode is formed so as to be exposed also on the substrate outside the trench, and the gate electrode is disposed so as to cover upper portions of both ends of the trench and so as to form at least one concave portion having a depth reaching the substrate in a center portion.</p>
申请公布号 JP5662865(B2) 申请公布日期 2015.02.04
申请号 JP20110079784 申请日期 2011.03.31
申请人 发明人
分类号 H01L21/336;H01L29/41;H01L29/423;H01L29/49;H01L29/78 主分类号 H01L21/336
代理机构 代理人
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