发明名称 ARRAY DESIGN AND ARRAY PERFORMANCE ANALYSIS METHOD FOR SENSOR FAULT
摘要 <p>The present invention relates to an array performance analysis method which can analyze array performance at an array design and a sensor fault and quantitatively display an analysis result. The present invention, if array design information, sensor position adjusting information and faulted sensor information are set on an array setup screen, generates an array with a set shape where the information is reflected; adjusts a position of a corresponding installed sensor in the array according to the sensor position adjusting information, then generates a beam pattern in accordance with the generated array, the adjusted sensor position and the set faulted sensor; and analyzes the generated beam pattern and quantitatively displays performance (beam patterns and orientation indexes) variations in accordance with the array design or sensor fault with performance reference lines on a performance analysis screen.</p>
申请公布号 KR101489673(B1) 申请公布日期 2015.02.04
申请号 KR20130109934 申请日期 2013.09.12
申请人 发明人
分类号 G06F3/14;G06F17/50;G06F19/00 主分类号 G06F3/14
代理机构 代理人
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