发明名称 Apparatus for recognizing wafer's mark
摘要 <p>According to an embodiment of the present invention, an apparatus for recognizing a wafer mark, which recognizes a mark engraved on each wafer stored in a cassette, comprises: a mark reflection mirror for reflecting a mark engraved on a wafer; an image photographing unit for photographing the mark reflected in the mark reflection mirror; and a robot arm in which the mark reflection mirror and the image photographing unit are installed, and which inserts the mark reflection mirror into a cassette to place the mark reflection mirror near the mark on the wafer.</p>
申请公布号 KR20150012723(A) 申请公布日期 2015.02.04
申请号 KR20130088595 申请日期 2013.07.26
申请人 发明人
分类号 H01L21/02;H01L21/66 主分类号 H01L21/02
代理机构 代理人
主权项
地址
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