| 摘要 |
An x-ray imaging apparatus 100 determines the surface profile of an object 105 under inspection. The apparatus comprises: an x-ray source 101 producing a scanning beam 104; a detector assembly 102, 103 providing a signal representative of the intensity of backscattered x-rays from the object; and processing circuitry to determine a time difference between the x-ray source 101 being switched on and the backscattered x-rays arriving at the detector assembly 102, 103. The apparatus may be mounted on a vehicle. In one embodiment the x-ray source produces a scanning pencil beam. The apparatus may be contained within a portal gantry where it is integrated into at least two of the sides. The x-ray source may be a flying spot x-ray source which produces a flying spot scanning beam. The apparatus may further comprise a transmission imaging system comprising a pulsed linear accelerator x-ray source which may not interact with the object at the same time as the flying spot. |
