发明名称 Capacitance measurement of high voltage device
摘要 Described herein are systems and methods that facilitate the measurement of the capacitance of high voltage devices while shielding an active device involved in the measurement from the high voltage. The systems and methods employ capacitors to store the high voltage such that the active device does not experience the high voltage. Placement of a reset device ensures that the active device is shielded from the high voltage.
申请公布号 US8947107(B2) 申请公布日期 2015.02.03
申请号 US201313765965 申请日期 2013.02.13
申请人 Semtech Corporation 发明人 Chevroulet Michel Alain
分类号 G01R27/26 主分类号 G01R27/26
代理机构 Amin, Turocy & Watson, LLP 代理人 Amin, Turocy & Watson, LLP
主权项 1. A system, comprising: an amplifier comprising a positive input, a negative input, and an output; a first capacitor connected to the negative input of the amplifier and to an external device with an unknown capacitance, wherein the first capacitor stores a first voltage; a second capacitor connected to the output of the amplifier and to the external device, wherein the second capacitor stores the first voltage; a voltage source device that supplies a second voltage to the positive input of the amplifier; a reset device that connects the output of the amplifier and the negative input of the amplifier; and a detector device that measures a change in the output voltage of the amplifier as a function of a change in the second voltage supplied by the voltage source and function of the unknown capacitance of the external device, wherein the first voltage is higher than the second voltage.
地址 Camarillo CA US
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