发明名称 Read operation method of memory device
摘要 <p>A read operation method of a memory device includes applying a first voltage to each of a first memory cell and a second memory cell during a first read operation, applying the first voltage to the first memory cell and a second voltage to the second memory cell during a second read operation, and applying the second voltage to the first memory cell and the first voltage to the second memory cell during a third read operation.</p>
申请公布号 KR101489392(B1) 申请公布日期 2015.02.03
申请号 KR20090007908 申请日期 2009.02.02
申请人 发明人
分类号 G11C16/26;G11C16/30 主分类号 G11C16/26
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