发明名称 Apparatus and method for testing driver writeability strength on an integrated circuit
摘要 An apparatus and method for testing driver write-ability strength on an integrated circuit includes one or more drive detection units each including a number of drivers. At least some of the drivers may have a different drive strength and each may drive a voltage onto a respective driver output line. Each drive detection unit may include a number of keeper circuits, each coupled to a separate output line and configured to retain a given voltage on the output line to which it is coupled. Each detection unit may also include a number of detection circuits coupled to detect the drive voltage on each of the output lines. In one implementation, the drive voltage appearing at the output line of each driver may be indicative of that the driver was able to overdrive the voltage being retained on the output line to which it is coupled by the respective keeper circuits.
申请公布号 US8947070(B2) 申请公布日期 2015.02.03
申请号 US201213351313 申请日期 2012.01.17
申请人 Apple Inc. 发明人 Jain Ashish R.;Klass Edgardo F.
分类号 G11C8/00;G01R31/3185;G01R31/319 主分类号 G11C8/00
代理机构 Meyertons, Hood, Kivlin, Kowert & Goetzel, P.C. 代理人 Meyertons, Hood, Kivlin, Kowert & Goetzel, P.C. ;Curran Stephen J.
主权项 1. An integrated circuit comprising: one or more drive detection units, wherein each drive detection unit includes: a first write driver having a first drive strength and configured to drive a first drive voltage on a first output line;a second write driver having a second drive strength and configured to drive a second drive voltage on a second output line;a first keeper circuit associated with the first write driver and configured to retain a given voltage level at the first output line of the first write driver;a second keeper circuit associated with the second write driver and configured to retain another given voltage level at the second output line of the second write driver;a first detection circuit associated with the first write driver and configured to detect whether the first drive voltage is being driven on the first output line; anda second detection circuit associated with the second write driver and configured to detect whether the second drive voltage is being driven on the second output line.
地址 Cupertino CA US