发明名称 |
Nonvolatile semiconductor memory apparatus |
摘要 |
According to one embodiment, a nonvolatile semiconductor memory apparatus includes a memory cell array, a row decoder, a controller. The memory cell array includes a plurality of memory strings. The memory strings include a first select transistor and a second select transistor, and are connected to each of a plurality of bit lines. The row decoder applies a voltage to the first and second select transistors. The controller detects a defect of the bit lines based on data read from the memory cells. |
申请公布号 |
US8947933(B2) |
申请公布日期 |
2015.02.03 |
申请号 |
US201313913024 |
申请日期 |
2013.06.07 |
申请人 |
Kabushiki Kaisha Toshiba |
发明人 |
Tokiwa Naoya;Nagadomi Yasushi |
分类号 |
G11C16/06;G11C16/04 |
主分类号 |
G11C16/06 |
代理机构 |
Holtz, Holtz, Goodman & Chick PC |
代理人 |
Holtz, Holtz, Goodman & Chick PC |
主权项 |
1. A nonvolatile semiconductor memory apparatus comprising:
a memory cell array including a block, the block including a plurality of memory strings, the memory strings being coupled to a plurality of bit lines, the plurality of bit lines including a first bit line which is coupled to n memory strings in the block, and each memory string including a plurality of memory cells stacked and a first select transistor; a row decoder capable of selecting k memory strings in the block (where k is equal to or greater than 2, and k is less than n), the k memory strings being coupled to the first bit line, and the k memory strings being disposed next to each other; and a controller configured to detect a defect based on data read from the memory cells provided in a selected memory string. |
地址 |
Tokyo JP |