| 摘要 |
<p>PROBLEM TO BE SOLVED: To provide a method for accurately measuring a distortion and a deflection angle of an object without performing calibration even when a camera is not installed in front of the object.SOLUTION: Assume that a point A and a point B are located on an x-axis in an initial state. A deflection angleΔθmade by a line segment coupling a point A' and a point B' after being deformed and the line segment parallel to the x-axis can show an x' with a pas a pitch of a lattice in an x direction from the difference between phasesφ(i,j) of the lattice of the x direction after deformation of the two points A and B, and Y' can be shown from a displacement amount d(i,j) in a y direction of the two points A and B, and can be obtained by obtaining an i-direction componentδdy(i,j)/δi of a distribution of d(i,j) and i-direction componentδφ'(i,j)/δi of a distribution ofφ'(i,j), respectively, using a plurality of pixels in the vicinity of an attention point.</p> |
