发明名称 |
FIELD EFFECT TRANSISTOR, SEMICONDUCTOR DEVICE AND METHOD FOR MANUFACTURING FIELD EFFECT TRANSISTOR |
摘要 |
PROBLEM TO BE SOLVED: To provide a field effect transistor, a semiconductor device and a method for manufacturing a field effect transistor, which can improve drain withstand voltage (BVdss-ON) in an ON state and inhibit deterioration in characteristics caused by hot carrier.SOLUTION: A field effect transistor comprises: a field oxide film 31 arranged on an N-type drift region 20 located between a channel region and N-type drain 9 of a silicon substrate 1; an N-type drift layer 21 arranged below the drift region 20 and the drain 9 of the silicon substrate 1; and an N-type field relaxation layer 25 arranged on an extension part 21A that a drift layer 21 of the silicon substrate 1 has. The field relaxation layer 25 is an impurity diffusion layer having an N-type impurity concentration higher than that of the drift layer 21. |
申请公布号 |
JP2015023208(A) |
申请公布日期 |
2015.02.02 |
申请号 |
JP20130151580 |
申请日期 |
2013.07.22 |
申请人 |
ASAHI KASEI ELECTRONICS CO LTD |
发明人 |
MATSUDA JUNICHI;TAKAHASHI YOSHIICHI |
分类号 |
H01L21/336;H01L29/78 |
主分类号 |
H01L21/336 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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