| 摘要 |
<p>PROBLEM TO BE SOLVED: To provide an image measurement device that enables a measurement position suitable for a stitching algorithm to be set.SOLUTION: An image measurement device measuring a measurement object range with a plurality of measurement fields of view, comprises: measurement position setting means for setting a plurality of measurement positions including a measurement object range so as to have an overlapping area where adjacent measurement fields of view overlap with each other; measurement means for performing a measurement at the measurement position set by the measurement position setting means; and evaluation means for calculating an evaluation value indicative of a level where the overlapping area of the adjacent measurement fields of view is suitable for coupling of a measurement result in the adjacent measurement fields of view. The measurement position setting means sets the measurement position on the basis of the evaluation value calculated by the evaluation means.</p> |
