发明名称 SEMICONDUCTOR DEVICE AND METHOD FOR FABRICATING THE SAME
摘要 The present invention provides a semiconductor device which can improve a breakdown voltage and can reduce the device size. A semiconductor device according to the present invention includes an emitter electrode and a first field plate disposed on one surface of a substrate and spaced apart from each other, a collector electrode disposed on the other surface of the substrate, a trench gate disposed in the substrate, a field diffusion junction disposed in the substrate, and a first contact connecting the trench gate and the first field plate. The first field plate has a first part extending toward the emitter electrode with respect to the first contact and having a first width, and a second part extending toward the field diffusion junction with respect to the first contact and having a second width. The second width is greater than the first width.
申请公布号 KR20150011185(A) 申请公布日期 2015.01.30
申请号 KR20130086137 申请日期 2013.07.22
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 LEE, JAE HOON;KIM, TAE GEUN;PARK CHAN HO;HER, HYUN JUNG
分类号 H01L29/739;H01L21/331 主分类号 H01L29/739
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