发明名称 |
DETECTING METHOD OF DEFECT OF BARRIER FILM AND DETECTING APPARATUS OF DEFECT OF BARRIER FILM FOR FLAT PANEL DISPLAY DEVICE |
摘要 |
<p>The present invention relates to a detecting method of defects of a barrier film, and a detecting apparatus of defects of a barrier film, in which the detecting method of defects of a barrier film comprises a step of preparing a device including an electrode and a barrier film covering the electrode; a step of irradiating infrared rays to the barrier film; a step of firstly mapping by measuring the infrared transmittance to the device; a step of aging the device under the oxygen atmosphere; a step of irradiating infrared rays to the barrier film; a step of secondly mapping by measuring the infrared transmittance to the device; and a step of comparing the first map with the second map.</p> |
申请公布号 |
KR20150010227(A) |
申请公布日期 |
2015.01.28 |
申请号 |
KR20130084924 |
申请日期 |
2013.07.18 |
申请人 |
SAMSUNG DISPLAY CO., LTD. |
发明人 |
VORONOV ALEXANDER;MASLOV DMITRY;JUNG, SEUNG HWAN;HAN, GYOO WAN;JUNG, JI HUNNY |
分类号 |
G01N21/88;H01L51/56 |
主分类号 |
G01N21/88 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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