发明名称 DETECTING METHOD OF DEFECT OF BARRIER FILM AND DETECTING APPARATUS OF DEFECT OF BARRIER FILM FOR FLAT PANEL DISPLAY DEVICE
摘要 <p>The present invention relates to a detecting method of defects of a barrier film, and a detecting apparatus of defects of a barrier film, in which the detecting method of defects of a barrier film comprises a step of preparing a device including an electrode and a barrier film covering the electrode; a step of irradiating infrared rays to the barrier film; a step of firstly mapping by measuring the infrared transmittance to the device; a step of aging the device under the oxygen atmosphere; a step of irradiating infrared rays to the barrier film; a step of secondly mapping by measuring the infrared transmittance to the device; and a step of comparing the first map with the second map.</p>
申请公布号 KR20150010227(A) 申请公布日期 2015.01.28
申请号 KR20130084924 申请日期 2013.07.18
申请人 SAMSUNG DISPLAY CO., LTD. 发明人 VORONOV ALEXANDER;MASLOV DMITRY;JUNG, SEUNG HWAN;HAN, GYOO WAN;JUNG, JI HUNNY
分类号 G01N21/88;H01L51/56 主分类号 G01N21/88
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