发明名称 Automatic flaw detection device
摘要 An automatic flaw detection apparatus comprises a supporting frame; a rotational frame supported inside the supporting frame in a freely rotatable manner by means of bearings; a hollow shaft which is supported by and inside the rotational frame, through the interior of which passes a material to be inspected; a holder which is disposed within the hollow shaft extending in the longitudinal direction of the axis of the hollow shaft and rotates in association with the hollow shaft, the a sensor incorporated in the holder to detect any defect in the material to be probed; and a signal transmission device which is placed between the hollow shaft and the rotational frame and comprises a stator section supported by the supporting frame and a rotor section supported by the hollow shaft or the rotational frame to be electrically in association with the stator section, and which transmits flaw detection signal from the sensor to the outside.
申请公布号 US4562738(A) 申请公布日期 1986.01.07
申请号 US19840596700 申请日期 1984.04.04
申请人 MITSUBISHI DENKI KABUSHIKI KAISHA 发明人 NAKAYAMA, KAZUO;NAITO, YUKIO;MUNESUE, EIJI
分类号 G01N29/26;(IPC1-7):G01N29/04 主分类号 G01N29/26
代理机构 代理人
主权项
地址