发明名称 |
SEMICONDUCTOR DEVICE AND METHOD FOR FABRICATING THE SAME |
摘要 |
The present invention relates to a semiconductor device capable of improving the threshold voltage of a transistor. The semiconductor device includes: a substrate which includes a first active region, a second active region, and a field region directly touched between the first active region and the second active region; and a gate structure which crosses the first active region, the second active region, and the field region, on the substrate. The gate structure includes a p-type metal gate electrode and an n-type metal gate electrode to directly connect with each other. The p-type metal gate electrode is formed on the first active region. The n-type metal gate electrode is formed on the second active region. The contact surface of the p-type metal gate electrode and the n-type metal gate electrode is closer to the first active region than the second active region. |
申请公布号 |
KR20150008680(A) |
申请公布日期 |
2015.01.23 |
申请号 |
KR20130082936 |
申请日期 |
2013.07.15 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
KIM, JU YOUN;JANG, HYUNG SOON;YOUN, JONG MIL;HA, TAE WON |
分类号 |
H01L29/78;H01L21/336 |
主分类号 |
H01L29/78 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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