发明名称 SEMICONDUCTOR DEVICE AND METHOD FOR FABRICATING THE SAME
摘要 The present invention relates to a semiconductor device capable of improving the threshold voltage of a transistor. The semiconductor device includes: a substrate which includes a first active region, a second active region, and a field region directly touched between the first active region and the second active region; and a gate structure which crosses the first active region, the second active region, and the field region, on the substrate. The gate structure includes a p-type metal gate electrode and an n-type metal gate electrode to directly connect with each other. The p-type metal gate electrode is formed on the first active region. The n-type metal gate electrode is formed on the second active region. The contact surface of the p-type metal gate electrode and the n-type metal gate electrode is closer to the first active region than the second active region.
申请公布号 KR20150008680(A) 申请公布日期 2015.01.23
申请号 KR20130082936 申请日期 2013.07.15
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 KIM, JU YOUN;JANG, HYUNG SOON;YOUN, JONG MIL;HA, TAE WON
分类号 H01L29/78;H01L21/336 主分类号 H01L29/78
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