发明名称 SEMICONDUCTOR DEVICE HAVING LOCAL BURIED OXIDE
摘要 There is set forth herein a semiconductor device fabricated on a bulk wafer having a local buried oxide region underneath a channel region of a MOSFET. In one embodiment the local buried oxide region can be self-aligned to a gate, and a source/drain region can be formed in a bulk substrate. A local buried oxide region can be formed in a semiconductor device by implantation of oxygen into a bulk region of the semiconductor device followed by annealing.
申请公布号 US2015024557(A1) 申请公布日期 2015.01.22
申请号 US201313943849 申请日期 2013.07.17
申请人 GLOBALFOUNDRIES Inc. 发明人 LIU Yanxiang;CHI Min-hwa
分类号 H01L29/66 主分类号 H01L29/66
代理机构 代理人
主权项 1. A semiconductor device comprising: a substrate; a local buried oxide region formed in the substrate; a gate aligned with the local buried oxide region; a channel defined in the substrate between the gate and the local buried oxide region, the channel having a first end and a second end: a source defined at the first end of the channel; and a drain defined at the second end of the channel.
地址 Grand Cayman KY