发明名称 SUBSTRATE INSPECTION METHOD
摘要 PROBLEM TO BE SOLVED: To swiftly evaluate with a simple method the state of the surface of a substrate to be applied with a droplet from a coating head.SOLUTION: A substrate inspection method is a method for evaluating the state of a droplet mark which is formed on a substrate by ejecting droplet over the substrate plural nozzle holes formed on a coating head. The method includes the steps of: forming droplet marks of a lattice-like pattern in a whole area of the substrate by ejecting droplets from a coating head above the substrate over the whole area of the substrate; taking an image of the droplet marks on the whole area of the substrate using a camera disposed above the upper surface of the substrate while irradiating the substrate with the droplet marks formed thereon; and checking the color of all droplet marks in the whole area of the substrate by binarizing the gray value of the taken image.
申请公布号 JP2015014522(A) 申请公布日期 2015.01.22
申请号 JP20130141477 申请日期 2013.07.05
申请人 PANASONIC CORP 发明人 MIYAZAWA KAZUTOSHI
分类号 G01N21/47;B05D1/26;G01N21/17 主分类号 G01N21/47
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