ANALOG-TO-DIGITAL CONVERTER FOR BUILT-IN-SELF-TEST

摘要

PROBLEM TO BE SOLVED: To provide an analog-to-digital converter for built-in-self-test (BIST).SOLUTION: A semiconductor chip with a built-in-self-test (BIST) circuit 280 comprises: a first analog-to-digital converter (ADC) 110 configured to convert an analog input voltage signal Vin received at its input into a digital output voltage signal Vo that characterizes the first ADC; and a second ADC 120 connected with the input of the first ADC and configured to convert the analog input voltage signal received at its input into a digital feedback voltage signal Vfb. In the semiconductor chip, the analog input voltage signal is generated based on the digital feedback signal.