发明名称 |
SEMICONDUCTOR DEVICE AND ELECTRIC CIRCUIT |
摘要 |
<p>PROBLEM TO BE SOLVED: To provide a semiconductor device which can correctly measure temperatures of two semiconductor elements by one temperature sensor.SOLUTION: A semiconductor device comprises: a first switching element Tr1 and a second switching element Tr2, which are arranged opposite to each other across inter-element connection second wiring 14AA, and a source electrode S of the first switching element Tr1 and a drain electrode D of the second switching element Tr2 are electrically connected to the inter-element connection second wiring 14AA; and a thermistor Th is arranged lateral to the first switching element Tr1. A first electrode Q of the thermistor Th is electrically connected with the inter-element connection second wiring 14AA by a ninth via 39 which pierces a third insulation film 23.</p> |
申请公布号 |
JP2015015348(A) |
申请公布日期 |
2015.01.22 |
申请号 |
JP20130140746 |
申请日期 |
2013.07.04 |
申请人 |
JTEKT CORP;DENSO CORP |
发明人 |
NAGASE SHIGEKI;TADA KAZUO |
分类号 |
H01L25/07;H01L23/58;H01L25/18;H03K17/14;H03K17/687 |
主分类号 |
H01L25/07 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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