发明名称 SEMICONDUCTOR DEVICE AND ELECTRIC CIRCUIT
摘要 <p>PROBLEM TO BE SOLVED: To provide a semiconductor device which can correctly measure temperatures of two semiconductor elements by one temperature sensor.SOLUTION: A semiconductor device comprises: a first switching element Tr1 and a second switching element Tr2, which are arranged opposite to each other across inter-element connection second wiring 14AA, and a source electrode S of the first switching element Tr1 and a drain electrode D of the second switching element Tr2 are electrically connected to the inter-element connection second wiring 14AA; and a thermistor Th is arranged lateral to the first switching element Tr1. A first electrode Q of the thermistor Th is electrically connected with the inter-element connection second wiring 14AA by a ninth via 39 which pierces a third insulation film 23.</p>
申请公布号 JP2015015348(A) 申请公布日期 2015.01.22
申请号 JP20130140746 申请日期 2013.07.04
申请人 JTEKT CORP;DENSO CORP 发明人 NAGASE SHIGEKI;TADA KAZUO
分类号 H01L25/07;H01L23/58;H01L25/18;H03K17/14;H03K17/687 主分类号 H01L25/07
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