发明名称 SELF-ALIGNED GATE BURIED CHANNEL FIELD EFFECT TRANSISTOR
摘要 <p>This disclosure provides a transistor device formed on a wide band gap substrate. The transistor device includes a channel layer and a gate structure physically coupled to the channel layer. The gate structure can be formed on the channel layer using an epitaxial process instead of a lithographic process, thereby providing a mechanism to build small semiconductor features that are smaller than a resolution of the state-of-the-art lithographic process and reducing the amount of impurities between the channel layer and the gate structure.</p>
申请公布号 WO2015010121(A1) 申请公布日期 2015.01.22
申请号 WO2014US47422 申请日期 2014.07.21
申请人 RAMGOSS, INC. 发明人 ADEKORE, BUNMI, T.;MARCHAND, HUGUES
分类号 H01L27/108 主分类号 H01L27/108
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