发明名称 |
SUBSTRATE PROCESSING METHOD, AND CONTROL DEVICE |
摘要 |
PROBLEM TO BE SOLVED: To provide a substrate processing method capable of controlling an etching amount to a desired one in an etching process within a vertical substrate processing apparatus.SOLUTION: A substrate processing method uses a control device for controlling actuation of a vertical substrate processing apparatus having: a processing container in which a substrate holder for holding a plurality of substrates in multiple stages at predetermined intervals; a heater for heating inside of the processing container; an etching gas introduction part for introducing deposition gas and etching gas into the processing container; and an exhaust part for exhausting the inside of the processing container. The substrate processing method includes: a calculation process for calculating an etching condition by the control device so that an etching amount of a deposition material on the substrate, on which a predetermined uneven pattern is formed in advance and the deposition material is deposited in a recessed part of the pattern, becomes a desired etching amount; and a treatment process for applying etching treatment to the substrate based on the calculated etching condition. |
申请公布号 |
JP2015015315(A) |
申请公布日期 |
2015.01.22 |
申请号 |
JP20130140155 |
申请日期 |
2013.07.03 |
申请人 |
TOKYO ELECTRON LTD |
发明人 |
TAKENAGA YUICHI;KOMORI KATSUHIKO |
分类号 |
H01L21/302;C23C16/455;C23C16/52;H01L21/205;H01L21/31 |
主分类号 |
H01L21/302 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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