发明名称 TEMPERATURE TEST UNIT WITH PROCESSOR
摘要 A temperature test unit includes two thermometers each having a probe for detecting a temperature at a heat exchanging system, a processing mechanism electrically connected to the thermometers for receiving and processing the temperature readouts, and for obtaining a temperature difference between the temperature readouts, and a displayer device electrically connected to the processing mechanism and having two portions for displaying the temperature readouts of the thermometers, and another portion for displaying the temperature difference between the temperature readouts of the thermometers and for allowing the user to diagnose the problem in the heat exchanging system correctly and instantly.
申请公布号 US2015023390(A1) 申请公布日期 2015.01.22
申请号 US201313945958 申请日期 2013.07.19
申请人 CHU Henry C. 发明人 CHU Henry C.
分类号 G01K1/02 主分类号 G01K1/02
代理机构 代理人
主权项 1. A temperature test unit comprising: a first thermometer and a second thermometer each including a probe for detecting a temperature at a heat exchanging system, a processing mechanism electrically connected to said first and said second thermometers for receiving and obtaining temperature readouts from said first and said second thermometers respectively and for processing said temperature readouts, and for obtaining a temperature difference between said temperature readouts, and a displayer device electrically connected to said processing mechanism and including a first portion for displaying said temperature readout of said first thermometer, a second portion for displaying said temperature readout of said second thermometer, and a third portion for displaying said temperature difference between said temperature readouts of said first and said second thermometers.
地址 US