发明名称 |
METHOD OF MAKING A RESISTIVE RANDOM ACCESS MEMORY DEVICE |
摘要 |
The disclosed technology generally relates to the field of semiconductor processing and more particularly to resistive random access memory and methods for manufacturing such memory. In one aspect, a method of fabricating a memory cell includes providing a substrate and providing a first electrode on the substrate. The method additionally includes depositing, via atomic layer deposition, a resistive switching material on the first electrode, wherein the resistive switching material comprises an oxide comprising a pnictogen chosen from the group consisting of As, Bi, Sb, and P. The resistive switching material may be doped, e.g., with Sb or an antimony-metal alloy. A second electrode may be formed over and in contact with the resistive switching material. |
申请公布号 |
US2015021540(A1) |
申请公布日期 |
2015.01.22 |
申请号 |
US201414334566 |
申请日期 |
2014.07.17 |
申请人 |
ASM IP Holding B.V. |
发明人 |
Xie Qi;Maes Jan Willem;Blomberg Tom;Tuominen Marko;Haukka Suvi;Roelofs Robin;Woodruff Jacob |
分类号 |
H01L45/00 |
主分类号 |
H01L45/00 |
代理机构 |
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代理人 |
|
主权项 |
1. A method of fabricating a memory cell, comprising:
providing a substrate; providing a first electrode on the substrate; and depositing, via atomic layer deposition, a resistive switching material on the first electrode, wherein the resistive switching material comprises an oxide comprising a pnictogen chosen from the group consisting of As, Bi, Sb, and P. |
地址 |
Almere NL |