发明名称 METHOD OF MAKING A RESISTIVE RANDOM ACCESS MEMORY DEVICE
摘要 The disclosed technology generally relates to the field of semiconductor processing and more particularly to resistive random access memory and methods for manufacturing such memory. In one aspect, a method of fabricating a memory cell includes providing a substrate and providing a first electrode on the substrate. The method additionally includes depositing, via atomic layer deposition, a resistive switching material on the first electrode, wherein the resistive switching material comprises an oxide comprising a pnictogen chosen from the group consisting of As, Bi, Sb, and P. The resistive switching material may be doped, e.g., with Sb or an antimony-metal alloy. A second electrode may be formed over and in contact with the resistive switching material.
申请公布号 US2015021540(A1) 申请公布日期 2015.01.22
申请号 US201414334566 申请日期 2014.07.17
申请人 ASM IP Holding B.V. 发明人 Xie Qi;Maes Jan Willem;Blomberg Tom;Tuominen Marko;Haukka Suvi;Roelofs Robin;Woodruff Jacob
分类号 H01L45/00 主分类号 H01L45/00
代理机构 代理人
主权项 1. A method of fabricating a memory cell, comprising: providing a substrate; providing a first electrode on the substrate; and depositing, via atomic layer deposition, a resistive switching material on the first electrode, wherein the resistive switching material comprises an oxide comprising a pnictogen chosen from the group consisting of As, Bi, Sb, and P.
地址 Almere NL