发明名称 INTEGRATED CIRCUIT AND METHOD OF FORMING THE INTEGRATED CIRCUIT
摘要 <p>In described examples, an integrated circuit (100) includes a substrate (110) having a first conductivity type, a logic region, and a memory region. A trench isolation structure (112) touches the substrate (110). A logic transistor (114) has: a logic gate dielectric (126) that touches and lies over the logic region of the substrate (110); and a logic gate (130) that touches and lies over the logic gate dielectric (126). A memory transistor (116) has: a memory gate dielectric (146) that touches and lies over the memory region of the substrate (110); and a memory gate (150) that touches and lies over the memory gate dielectric (146). A resistor (118) touches and lies over the trench isolation structure (112). The resistor (118) has a dopant concentration that is substantially equal to a dopant concentration of the memory gate (150) and substantially less than a dopant concentration of the logic gate (130).</p>
申请公布号 WO2015009791(A1) 申请公布日期 2015.01.22
申请号 WO2014US46802 申请日期 2014.07.16
申请人 TEXAS INSTRUMENTS INCORPORATED;TEXAS INSTRUMENTS JAPAN LIMITED 发明人 PAL, HIMADRI, SEKHAR;ESHUN, EBENEZER;EKBOTE, SHASHANK, S.
分类号 H01L29/792;H01L21/8232 主分类号 H01L29/792
代理机构 代理人
主权项
地址