发明名称 |
INTEGRATED CIRCUIT AND METHOD OF FORMING THE INTEGRATED CIRCUIT |
摘要 |
<p>In described examples, an integrated circuit (100) includes a substrate (110) having a first conductivity type, a logic region, and a memory region. A trench isolation structure (112) touches the substrate (110). A logic transistor (114) has: a logic gate dielectric (126) that touches and lies over the logic region of the substrate (110); and a logic gate (130) that touches and lies over the logic gate dielectric (126). A memory transistor (116) has: a memory gate dielectric (146) that touches and lies over the memory region of the substrate (110); and a memory gate (150) that touches and lies over the memory gate dielectric (146). A resistor (118) touches and lies over the trench isolation structure (112). The resistor (118) has a dopant concentration that is substantially equal to a dopant concentration of the memory gate (150) and substantially less than a dopant concentration of the logic gate (130).</p> |
申请公布号 |
WO2015009791(A1) |
申请公布日期 |
2015.01.22 |
申请号 |
WO2014US46802 |
申请日期 |
2014.07.16 |
申请人 |
TEXAS INSTRUMENTS INCORPORATED;TEXAS INSTRUMENTS JAPAN LIMITED |
发明人 |
PAL, HIMADRI, SEKHAR;ESHUN, EBENEZER;EKBOTE, SHASHANK, S. |
分类号 |
H01L29/792;H01L21/8232 |
主分类号 |
H01L29/792 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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