发明名称 CHARGED PARTICLE BEAM DEVICE AND IMAGE ACQUISITION METHOD
摘要 <p>PROBLEM TO BE SOLVED: To solve such a problem that although the energy of a signal electron, that can be selected by the difference between a retarding voltage value and a voltage value applied to an energy filter, can be determined, adjustment to an optimum voltage value is difficult because there are a plurality of variable parameters when adjusting these voltage values, and to provide a charged particle beam device in which the optimum barrier conditions, e.g., the retarding voltage value and the voltage value being applied to the energy filter can be set simply.SOLUTION: A filter voltage, i.e., the difference of a booster voltage and a retarding voltage, is changed in a plurality of conditions, the image of a sample is generated in each conditions, and then the optimum value of the filter voltage is determined based on the contrast ratio or the contrast difference between the inside and outside of an observation object in an image thus generated.</p>
申请公布号 JP2015015201(A) 申请公布日期 2015.01.22
申请号 JP20130142231 申请日期 2013.07.08
申请人 HITACHI HIGH-TECHNOLOGIES CORP 发明人 HOSHINO HAYAYUKI;TACHIBANA ICHIRO;SUZUKI NAOMASA
分类号 H01J37/22;H01J37/244;H01J37/28;H01L21/66 主分类号 H01J37/22
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